561![TECHNOLOGY TRANSFER C-MET offers technology for the production of novel high dielectric and low loss microwave substrates for wireless communication applications Centre for Materials for Electronics Technology (C-MET), a TECHNOLOGY TRANSFER C-MET offers technology for the production of novel high dielectric and low loss microwave substrates for wireless communication applications Centre for Materials for Electronics Technology (C-MET), a](https://www.pdfsearch.io/img/0239761e03e0baa7a55014e630c6ae37.jpg) | Add to Reading ListSource URL: www.cmet.gov.inLanguage: English - Date: 2013-10-04 11:26:50
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562![COMAR Reports COMAR Technical Information Statement the IEEE exposure limits for radiofrequency and microwave energy Marvin C. Ziskin COMAR Reports COMAR Technical Information Statement the IEEE exposure limits for radiofrequency and microwave energy Marvin C. Ziskin](https://www.pdfsearch.io/img/4ad0129407381cac5d54c60997144e4e.jpg) | Add to Reading ListSource URL: ewh.ieee.orgLanguage: English - Date: 2005-04-20 20:20:02
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563![TECHNOLOGY Opportunity COMMUNICATIONS TECHNOLOGY High-Efficiency RF Power Amplifier NASA offers companies a TECHNOLOGY Opportunity COMMUNICATIONS TECHNOLOGY High-Efficiency RF Power Amplifier NASA offers companies a](https://www.pdfsearch.io/img/f64a84c1f1b8189c0cdd59de024d33e2.jpg) | Add to Reading ListSource URL: nasasolutions.comLanguage: English - Date: 2011-10-07 14:39:35
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564![Technology Opportunity National Aeronautics and Space Administration Technology Opportunity National Aeronautics and Space Administration](https://www.pdfsearch.io/img/ec780386d0b62b9866fe8f571b7c89a9.jpg) | Add to Reading ListSource URL: nasasolutions.comLanguage: English - Date: 2011-10-07 14:39:29
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565![NEWSLETTER NO. 62 JULY[removed]IEEE HISTORY CENTER Preserving, Researching, and Promoting the Legacy of Electrical Engineering and Computing ................................................. NEWSLETTER NO. 62 JULY[removed]IEEE HISTORY CENTER Preserving, Researching, and Promoting the Legacy of Electrical Engineering and Computing .................................................](https://www.pdfsearch.io/img/0cbdcee7a5075660cc1e1b19fbfbaee8.jpg) | Add to Reading ListSource URL: www.ieee.orgLanguage: English |
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566![Is AMI meter RF exposure safe? Yes. People are continuously exposed to very low levels of natural and man-made radio frequency fields, or RF. Even the earth’s surface and the human body are constant sources of RF field Is AMI meter RF exposure safe? Yes. People are continuously exposed to very low levels of natural and man-made radio frequency fields, or RF. Even the earth’s surface and the human body are constant sources of RF field](https://www.pdfsearch.io/img/b07ad1d66512f8accea69f6bba72a19f.jpg) | Add to Reading ListSource URL: navopache.coopwebbuilder.comLanguage: English - Date: 2012-05-10 10:45:00
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567![Research & Development Flight Program “These flying laboratories are equipped, or can be readily modified in-house to support any and all FAA projects requiring flight Research & Development Flight Program “These flying laboratories are equipped, or can be readily modified in-house to support any and all FAA projects requiring flight](https://www.pdfsearch.io/img/91cbd20cc1a537a93f65f5db55325097.jpg) | Add to Reading ListSource URL: www.tc.faa.govLanguage: English - Date: 2001-06-22 08:58:30
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568![Retail Food Store Sanitation Retail Food Store Sanitation](https://www.pdfsearch.io/img/e71fc6c62b6180fcd330ae359f377c52.jpg) | Add to Reading ListSource URL: www.state.tn.usLanguage: English - Date: 2013-01-02 12:26:07
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569![MDA Field Evaluation Worksheet Marking Instructions MDA Field Evaluation Worksheet Marking Instructions](https://www.pdfsearch.io/img/dcb55d7569782ff987cb370f32b1a8d6.jpg) | Add to Reading ListSource URL: www.michigan.govLanguage: English - Date: 2012-12-07 20:51:40
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570![Addendum D- MDA-FDA Report Marking Instructions Addendum D- MDA-FDA Report Marking Instructions](https://www.pdfsearch.io/img/4fd3042082dd371010b249a28b622682.jpg) | Add to Reading ListSource URL: www.michigan.govLanguage: English - Date: 2012-12-07 19:36:09
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